X-Ray Photoelectron Spectroscopy of Oxine-Metal Chelates

X - Ray Photoelectron Spectroscopy of Silicate Glasses

X-ray photoelectron spectroscopy (XPS) is a powerful technique capable of providing unique information about the structural chemistry of glasses. However, inappropriate procedures for the preparation of sample surfaces or the lack of reliable methods to overcome electrostatic charging effects during analysis of dielectric materials can cause spurious features to be introduced or intrinsic featu...

Al capping layers for nondestructive x-ray photoelectron spectroscopy analyses of transition-metal nitride thin films

Quantitative characterization of DNA films by X-ray photoelectron spectroscopy.

We describe the use of self-assembled films of thiolated (dT)25 single-stranded DNA (ssDNA) on gold as a model system for quantitative characterization of DNA films by X-ray photoelectron spectroscopy (XPS). We evaluate the applicability of a uniform and homogeneous overlayer-substrate model for data analysis, examine model parameters used to describe DNA films (e.g., density and electron atten...

Surface Characterization of Titanium Powders with X-ray Photoelectron Spectroscopy

Electron Beam Melting (EBM R ©) is a near-net-shape additive manufacturing technology developed by Arcam AB, where Ti-6Al-4V alloy powder is commonly used to manufacture medical implants and components for the aerospace industry. Although Arcam has developed special specifications of some parameters for the powders, the powders from different manufacturers do not behave in the same way in the E...

X-ray photoelectron spectroscopy of CeO2–Na2O–SiO2 glasses

A series of (CeO2)x–(Na2O)0.3–(SiO2)(0.7−x) glasses, where 0.025≤ x≤ 0.075, have been synthesized and investigated by mean of X-ray photoelectron spectroscopy (XPS). The Ce 3d spin-orbit doublet was curve fitted in order to quantify the proportions of each cerium oxidation state in these glasses. It was found that Ce ions are predominantly in the Ce(III) state in glasses with compositions x≤ 0....